Norstel announces completion of 150mm SiC n-type wafer development.

 

 

Norrköping, Sweden
13 September 2017

 

Norstel AB, Sweden, announces the successful development of low defect density 150mm Silicon Carbide (SiC) n-type substrates.

 

“With a micropipe density (MPD) below 0,2 cm-2 and a Threading Screw Dislocation (TSD) density below 500 cm-2, our first 150mm conductive 4H SiC substrates demonstrate […]